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1 article(s) from Burson, Kristen M

Modeling noncontact atomic force microscopy resolution on corrugated surfaces

Kristen M. Burson,
Mahito Yamamoto and
William G. Cullen

Beilstein J. Nanotechnol. 2012, 3, 230–237, doi:10.3762/bjnano.3.26

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Figure 1: AFM resolution examples: (a) high resolution UHV NC-AFM image of SiO₂ displaying features with radi...

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Figure 2: Verification of atom–substrate potential: Potential w_a_–_s versus z for numerical and analytical sche...

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Figure 3: Schematic illustrating the model geometry: The surface is sinusoidally corrugated along the x direc...

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Figure 4: Hamaker force for flat surfaces: Relationship between tip potential and distance from the surface. ...

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Figure 5: Hamaker force law for corrugated surfaces: Tip–sample distance dependence of tip potential for high...

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Figure 6: Contours of constant normalized frequency shift, γ, for a corrugated surface. Attenuation is observ...

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Published 13 Mar 2012

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